Equipment and Services
Measurement of X-ray diffraction patterns for various solid materials. Extensive database (PDF-2 Release 2013) for identification of crystalline phases. Unit cell parameters, crystallite size, crystallite orientation. Samples: max size 2cm⨉2cm⨉0.5 cm, thin films, powders.
Optical microscope PC-connected, integrated CCD-camera allows to save image, imprint scale-bar and make other annotations. Transmittance, reflectance mode. Bright field, Dark field mode. Polarizer. Brightness regulated by varing QTH lamp power or with neutral filters.
Optical spectrophotometer equipped with an integrating Sphere. Spectral range: 250-2500 nm, covers ultraviolet, visible, near-infrared (UV-Vis-NIR). Regimes: transmittance and reflectance, specular and diffuse components. Thin film interference allows to calculate thickness. Band-edge allows to calculate bandgap of semiconductors. Samples: solid materials, size appr. 2cm⨉2cm.
Variable Temperature Hall Effect Measurement System
Resistivity, carrier concentration and mobility of thin films at temperatures 100-580K. Allows calculation of activation energy of defect levels in the bandgap of semiconductors. Sample size 0.5cm⨉0.5cm⨉1mm, low resistive ohmic contact material is needed.